Avtor/Urednik | Weiss, Viola; Ohser, Joachim; Nagel, Werner | |
Naslov | Second moment measure and K-function for planar STIT tessellations | |
Tip | članek | |
Vir | Image Anal Stereol | |
Vol. in št. | Letnik 29, št. 2 | |
Leto izdaje | 2010 | |
Obseg | str. 121-31 | |
Jezik | eng | |
Deskriptorji | IMAGE PROCESSING, COMPUTER-ASSISTED STOCHASTIC PROCESSES MODELS, STATISTICAL |