Author/Editor | Navinšek, B; Panjan, P; Žabkar, A; Fine, J | |
Title | A comparison of sputtered Ni-Cr interface depth resolution as obtained by the quartz crystal microbalance mass-loss method and Auger spectroscopy | |
Type | članek | |
Source | Journal of vacuum science and technology A | |
Vol. and No. | Letnik 3, št. 3 | |
Publication year | 1985 | |
Volume | str. 671-3 | |
Language | eng |