Avtor/Urednik		Donnadieu, Patricia; Matsuda, Kenji; Epicier, Thierry; Douin, Joel
Naslov		Measurements of strain fields due to nanoscale precipitates using the phase image method
Tip		članek
Vir		Image Anal Stereol
Vol. in št.		Letnik 20, št. Suppl 1
Leto izdaje		2001
Obseg		str. 469-74
Jezik		eng
Abstrakt		Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.
Deskriptorji		ALUMINUM COMPOUNDS MATERIALS TESTING HARDNESS TESTS MICROSCOPY, ELECTRON IMAGE PROCESSING, COMPUTER-ASSISTED