Avtor/Urednik		Milani, Marziale; Drobne, Damjana; Tatti, Francesco; Batani, Dimitri; Poletti, Giulio; Orsini, Francesco; Zullini, Aldo; Zrimec, Alexis
Naslov		Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope
Tip		članek
Vir		Scanning
Vol. in št.		Letnik 27
Leto izdaje		2005
Obseg		str. 249-53
Jezik		eng
Abstrakt		A novel focused ion beam-based technique is presented for the read-out of microradiographs of Caenorhabditis elegans nematodes generated by soft x-ray contact microscopy (SXCM). In previous studies, the read-out was performed by atomic force microscopy (AFM), but in our work SXCM microradiographs were imaged by scanning ion microscopy (SINI) in a focused ion beam/scanning electron microscope (FIB/SEM).It allows an ad libitum selection of a sample region for gross morphologic to nanometric investigations, with a sequence of imaging and cutting. The FIB/SEM is less sensitive to height variation of the relief, and sectioning makes it possible to analyse the sample further. The SXCM can be coupled to SIM in a more efficient and faster way than to AFM. Scanning ion microscopy is the method of choice for the read-out of microradiographs of small multicellular organisms. Key words: focused ion beam, soft x-ray microscopy, atomic force microscopy, ultramicroscopy, Caenorhabditis elegans
Deskriptorji		NEMATODA MICRORADIOGRAPHY MICROSCOPY, ELECTRON, SCANNING MICROSCOPY, ATOMIC FORCE