| Avtor/Urednik | Gu, H; Čeh, M; Stemmer, S; Muellejans, H; Ruehle, M | |
| Naslov | A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale | |
| Tip | članek | |
| Vir | Ultramicroscopy | |
| Vol. in št. | Letnik 59 | |
| Leto izdaje | 1995 | |
| Obseg | str. 215-27 | |
| Jezik | eng |