Avtor/Urednik		Navinšek, B; Panjan, P; Žabkar, A; Fine, J
Naslov		A comparison of sputtered Ni-Cr interface depth resolution as obtained by the quartz crystal microbalance mass-loss method and Auger spectroscopy
Tip		članek
Vir		Journal of vacuum science and technology A
Vol. in št.		Letnik 3, št. 3
Leto izdaje		1985
Obseg		str. 671-3
Jezik		eng