Author/Editor		Gu, H; Čeh, M; Stemmer, S; Muellejans, H; Ruehle, M
Title		A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale
Type		članek
Source		Ultramicroscopy
Vol. and No.		Letnik 59
Publication year		1995
Volume		str. 215-27
Language		eng