Author/Editor		Navinšek, B; Panjan, P; Žabkar, A; Fine, J
Title		A comparison of sputtered Ni-Cr interface depth resolution as obtained by the quartz crystal microbalance mass-loss method and Auger spectroscopy
Type		članek
Source		Journal of vacuum science and technology A
Vol. and No.		Letnik 3, št. 3
Publication year		1985
Volume		str. 671-3
Language		eng